Few-Shot Metric Transfer Learning Network for Surface Defect Detection

Few-Shot Metric Transfer Learning Network for Surface Defect Detection

HUANG Jian, ZHENG Chunhou, ZHANG Jun, WANG Bing, CHEN Peng

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Pattern Recognition and Artificial Intelligence ›› 2021, Vol. 34 ›› Issue (5) : 407-414. DOI: 10.16451/j.cnki.issn1003-6059.202105003

Special Research on Detection, Discrimination and Tracking of Visual Object

Few-Shot Metric Transfer Learning Network for Surface Defect Detection

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{{article.zuoZheEn_L}}. {{article.title_en}}. {{journal.qiKanMingCheng_EN}}. 2021, 34(5): 407-414 https://doi.org/10.16451/j.cnki.issn1003-6059.202105003

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