Survey of Metric-Based Few-Shot Classification

Survey of Metric-Based Few-Shot Classification

LIU Xin, ZHOU Kairui, He Yulin, JING Liping, YU Jian

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Pattern Recognition and Artificial Intelligence ›› 2021, Vol. 34 ›› Issue (10) : 909-923. DOI: 10.16451/j.cnki.issn1003-6059.202110004

Adaptive Learning for Classification and Clustering

Survey of Metric-Based Few-Shot Classification

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{{article.zuoZheEn_L}}. {{article.title_en}}. {{journal.qiKanMingCheng_EN}}. 2021, 34(10): 909-923 https://doi.org/10.16451/j.cnki.issn1003-6059.202110004

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