Feature Descriptor Enhancement for Loop Detection Based on Metric Learning

Feature Descriptor Enhancement for Loop Detection Based on Metric Learning

HAN Bin, LUO Lun, LIU Xiongwei, SHEN Huiliang

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Pattern Recognition and Artificial Intelligence ›› 2022, Vol. 35 ›› Issue (1) : 51-61. DOI: 10.16451/j.cnki.issn1003-6059.202201005

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Feature Descriptor Enhancement for Loop Detection Based on Metric Learning

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{{article.zuoZheEn_L}}. {{article.title_en}}. {{journal.qiKanMingCheng_EN}}. 2022, 35(1): 51-61 https://doi.org/10.16451/j.cnki.issn1003-6059.202201005

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