模式识别与人工智能
Home      About Journal      Editorial Board      Instructions      Ethics Statement      Contact Us                   中文
Pattern Recognition and Artificial Intelligence  2022, Vol. 35 Issue (1): 51-61    DOI: 10.16451/j.cnki.issn1003-6059.202201005
Researches and Applications Current Issue| Next Issue| Archive| Adv Search |
Feature Descriptor Enhancement for Loop Detection Based on Metric Learning
HAN Bin1, LUO Lun1, LIU Xiongwei1, SHEN Huiliang1
1. College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou 310063

Copyright © 2010 Editorial Office of Pattern Recognition and Artificial Intelligence
Address: No.350 Shushanhu Road, Hefei, Anhui Province, P.R. China Tel: 0551-65591176 Fax:0551-65591176 Email: bjb@iim.ac.cn
Supported by Beijing Magtech  Email:support@magtech.com.cn