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Pattern Recognition and Artificial Intelligence  2022, Vol. 35 Issue (1): 51-61    DOI: 10.16451/j.cnki.issn1003-6059.202201005
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Feature Descriptor Enhancement for Loop Detection Based on Metric Learning
HAN Bin1, LUO Lun1, LIU Xiongwei1, SHEN Huiliang1
1. College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou 310063

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Abstract  Loop detection is an important part of simultaneous localization and mapping (SLAM). In most of the loop detection algorithms, feature descriptors are extracted from data frames, and loops are searched through the Euclidean distance between the descriptors. However, feature enhancement is not conducted on the extracted feature descriptors. In this paper, an algorithm of feature descriptor enhancement for loop detection based on metric learning is proposed. A lightweight algorithm module is designed to transform the feature space of the descriptors to enhance the distinguishing ability of the descriptors and improve the loop detection performance effectively. Pose and descriptors are combined to establish a triple dataset and thus the problem of fuzzy labels is solved. An idea of expanding the dataset is proposed to solve the problem of significantly insufficient loop samples. Based on triplet loss, the proposed loss function is adapted to the loop detection scene, and it is utilized to train a neural network module for feature space transformation. Experiments on KITTI and NCLT datasets show that the generalization ability of the proposed algorithm is strong.
Key wordsSimultaneous Localization and Mapping(SLAM)      Loop Detection      Feature Descriptor      Feature Enhancement      Metric Learning     
Received: 25 May 2021     
Corresponding Authors: SHEN Huiliang, Ph. D., professor. His research interests include image processing and computer vision.   
About author:: HAN Bin, master student. His research interests include lidar SLAM and machine learning.
LUO Lun, Ph. D. candidate. His research interests include lidar SLAM and lidar point cloud processing.
LIU Xiongwei, master student. His research interests include image processing and machine learning.
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HAN Bin
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HAN Bin,LUO Lun,LIU Xiongwei等. Feature Descriptor Enhancement for Loop Detection Based on Metric Learning[J]. Pattern Recognition and Artificial Intelligence, 2022, 35(1): 51-61.
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http://manu46.magtech.com.cn/Jweb_prai/EN/10.16451/j.cnki.issn1003-6059.202201005      OR     http://manu46.magtech.com.cn/Jweb_prai/EN/Y2022/V35/I1/51
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