模式识别与人工智能
Friday, Apr. 4, 2025 Home      About Journal      Editorial Board      Instructions      Ethics Statement      Contact Us                   中文
  2012, Vol. 25 Issue (4): 691-698    DOI:
Orignal Article Current Issue| Next Issue| Archive| Adv Search |
Path-Sensitive Multi-Variable Access Correlations Mining and Related Source Code Defects Detection
YU Xiu-Mei1,2, LIANG Bin1, CHEN Hong1, XIE Su-Bin1, WANG Mei-Lin2
1.School of Information,Renmin University of China,Beijing 100872
2.China Information Technology Security Evaluation Center,Beijing 100085

Download: PDF (457 KB)   HTML (1 KB) 
Export: BibTeX | EndNote (RIS)      
Abstract  A large number of widespread source systems make the security of source code of software increasingly important. Multi-variable access correlation rules are mined by the path-sensitive method and the defects caused by inconsistent access to correlated variables are detected automatically in the large-scale source code systems. Multi-variable access correlations can be mined via logical information of source code and sensitive path information, which avoids fault from the insensitive path method. The effective solutions to the uneven distribution of path weight and the path explosion problems are presented. The presented method is verified by Linux system, and the experimental result shows that it mines correct multi-variable access correlations.
Key wordsData Mining      Path Sensitive Aralysis      Multi-Variable Access Correlation      Source Code Defect Detection     
Received: 05 May 2011     
ZTFLH: TP309  
Service
E-mail this article
Add to my bookshelf
Add to citation manager
E-mail Alert
RSS
Articles by authors
YU Xiu-Mei
LIANG Bin
CHEN Hong
XIE Su-Bin
WANG Mei-Lin
Cite this article:   
YU Xiu-Mei,LIANG Bin,CHEN Hong等. Path-Sensitive Multi-Variable Access Correlations Mining and Related Source Code Defects Detection[J]. , 2012, 25(4): 691-698.
URL:  
http://manu46.magtech.com.cn/Jweb_prai/EN/      OR     http://manu46.magtech.com.cn/Jweb_prai/EN/Y2012/V25/I4/691
Copyright © 2010 Editorial Office of Pattern Recognition and Artificial Intelligence
Address: No.350 Shushanhu Road, Hefei, Anhui Province, P.R. China Tel: 0551-65591176 Fax:0551-65591176 Email: bjb@iim.ac.cn
Supported by Beijing Magtech  Email:support@magtech.com.cn