模式识别与人工智能
Friday, May. 2, 2025 Home      About Journal      Editorial Board      Instructions      Ethics Statement      Contact Us                   中文
  2013, Vol. 26 Issue (12): 1161-1168    DOI:
Orignal Article Current Issue| Next Issue| Archive| Adv Search |
Hierarchical Clustering Based on a Bayesian Harmony Measure
WEN Shun, ZHAO Jie-Yu, ZHU Shao-Jun
College of Information Science and Engineering, Ningbo University, Ningbo 315211

Download: PDF (1160 KB)   HTML (1 KB) 
Export: BibTeX | EndNote (RIS)      
Abstract  Hierarchical clustering is an important data analysis technique. Traditional hierarchical clustering methods measure the similarity between two classes based on the Euclidean distance metric, and those methods can not deal with the overlapping between classes and the changes of the class density in range effectively. In this paper, a hierarchical clustering method based on a Bayesian harmony measure is presented. Instead of the Euclidean distance, the increase in the harmony degree is used to measure the similarity between two classes. The Bayesian harmony degree, introduced from the Bayesian Ying-Yang harmony learning theory, can measure the distribution of the entire dataset and guide the selection of the number of categories. The proposed method overcomes the drawbacks of the traditional methods. With the measure of Bayesian harmony degree, it becomes easier to select the threshold to terminate the merger of the hierarchical clustering and to generate the right number of categories. The experimental results on benchmark problems confirm the effectiveness of the proposed method.
Key wordsHierarchical Clustering      Bayesian Harmony      Bayesian Ying-Yang Harmony Learning     
Received: 27 December 2012     
ZTFLH: TP 181  
Service
E-mail this article
Add to my bookshelf
Add to citation manager
E-mail Alert
RSS
Articles by authors
WEN Shun
ZHAO Jie-Yu
ZHU Shao-Jun
Cite this article:   
WEN Shun,ZHAO Jie-Yu,ZHU Shao-Jun. Hierarchical Clustering Based on a Bayesian Harmony Measure[J]. , 2013, 26(12): 1161-1168.
URL:  
http://manu46.magtech.com.cn/Jweb_prai/EN/      OR     http://manu46.magtech.com.cn/Jweb_prai/EN/Y2013/V26/I12/1161
Copyright © 2010 Editorial Office of Pattern Recognition and Artificial Intelligence
Address: No.350 Shushanhu Road, Hefei, Anhui Province, P.R. China Tel: 0551-65591176 Fax:0551-65591176 Email: bjb@iim.ac.cn
Supported by Beijing Magtech  Email:support@magtech.com.cn